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Incorporation of Interfacial Intermetallic Morphology in Fracture Mechanism Map for Sn-Ag-Cu Solder Joints

机译:界面金属间形态在Sn-Ag-Cu焊点断裂机理图中的应用

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摘要

A fracture mechanism map (FMM) is a powerful tool which correlates the fracture behavior of a material to its microstructural characteristics in an explicit and convenient way. In the FMM for solder joints, an effective thickness of the interfacial intermetallic compound (IMC) layer (t (eff)) and the solder yield strength (sigma (ys,eff)) are used as abscissa and ordinate axes, respectively, as these two predominantly affect the fracture behavior of solder joints. Earlier, a definition of t (eff), based on the uniform thickness of IMC (t (u)) and the average height of the IMC scallops (t (s)), was proposed and shown to aptly explain the fracture behavior of solder joints on Cu. This paper presents a more general definition of t (eff) that is more widely applicable to a range of metallizations, including Cu and electroless nickel immersion gold (ENIG). Using this new definition of t (eff), mode I FMM for SAC387/Cu joints has been updated and its validity was confirmed. A preliminary FMM for SAC387/Cu joints with ENIG metallization is also presented.
机译:断裂机制图(FMM)是一种功能强大的工具,可通过一种明确且方便的方式将材料的断裂行为与其微观结构特征相关联。在用于焊点的FMM中,界面金属间化合物(IMC)层的有效厚度(t(eff))和焊料屈服强度(sigma(ys,eff))分别用作横坐标和纵坐标,因为两个主要影响焊点的断裂行为。较早的时候,基于IMC的均匀厚度(t(u))和IMC扇贝的平均高度(t(s)),提出了t(eff)的定义,该定义可以恰当地解释焊料的断裂行为。铜接头。本文提出了t(eff)的更一般定义,它更广泛地适用于一系列金属化,包括Cu和化学镀镍沉金(ENIG)。使用t(eff)的这个新定义,已更新了SAC387 / Cu接头的模式I FMM,并确认了其有效性。还介绍了带有ENIG金属化层的SAC387 / Cu接头的初步FMM。

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